VHDL circuit testing project featuring scan-based TRCUT architecture with testbenches, LFSR-based pseudorandom input generation, MISR-based signature analysis with fault injection (stuck-at and transient), and full IEEE 1149.1 (JTAG) implementation with TAP controller and boundary scan.
Repository from Github https://github.comxrddev/circuit-reliability-testing
VHDL circuit testing project featuring scan-based TRCUT architecture with testbenches, LFSR-based pseudorandom input generation, MISR-based signature analysis with fault injection (stuck-at and transient), and full IEEE 1149.1 (JTAG) implementation with TAP controller and boundary scan.
MIT License