a571-op

a571-op

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VQ-VAE

Minimalist implementation of VQ-VAE in Pytorch

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wbm_project

wbm_project_0208

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wafer_defect_inspection

defect patterns classification of wm-811k wafer map

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pytorch-MNIST-CelebA-GAN-DCGAN

Pytorch implementation of Generative Adversarial Networks (GAN) and Deep Convolutional Generative Adversarial Networks (DCGAN) for MNIST and CelebA datasets

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NMF-For-Classification-of-Defects-on-Steel-Surface-

Non-negative matrix factorization is applied for classification of defects on steel surface using CNN

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Semi-Supervised-Learning-GAN

Semi-supervised Learning GAN

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imbalanced-semi-self

[NeurIPS 2020] Semi-Supervision (Unlabeled Data) & Self-Supervision Improve Class-Imbalanced / Long-Tailed Learning

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WaferDefects

Finding defects in wafers.

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nexperia

detect defects of semiconductors

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ActiveLearning_ImageClassification

Active Learning for Multiclass Image Classification on Fruits360 Dataset

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wafer-map-active-learning

Implementation of "Active Learning of Convolutional Neural Network for Cost-effective Wafer Map Pattern Classification".

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chip-wafer-classification-deep-learning

This project uses AWS machine learning and IoT tools to develop a deep learning defect classification model and use it for real-time defect detection on a device.

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SiliconWaferDefectDetection

A silicon wafer defect detection algorithm by python,now includes location and crack detection, further more

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WMPC_Stacking_TF2

Wafer map pattern classification using stacking ensemble with TF2 Keras

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Surface-Defect-Image-Classification-with-Convolutional-Neural-Network

The proposed idea is to use convolutional neural network (CNN) to classify defects on the semiconductor wafer substrate. There are total 7 classes to be classified. Data augmentation by Generative Adversarial Network (GAN) is applied on 2 of the classes to improve classification accuracy.

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DAGAN

DAGAN: Data Augmentation Generative Adversarial Networks

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Tiny-Defect-Detection-for-PCB

This is a repository about PCB defect detection.

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Wafer_maps

Pattern classification on wafer maps

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WaPIRL

Original PyTorch implementation of the paper 'Self-Supervised Representation Learning for Wafer Bin Map Defect Pattern Classification'

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ASL

Official Pytorch Implementation of: "Asymmetric Loss For Multi-Label Classification"(ICCV, 2021) paper

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DualCheXNet

The official split standards and non-official split standards of the ChestXray14 dataset.

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Keras-Multi-Label-Image-Classification

Keras- Multi Label Image Classification

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ML-ROS-multi-label-random-oversampling

unofficial Pytorch implementation of ML-ROS in Addressing imbalance in multi-label classification Measures and random resampling algorithms

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