This project contains the data and code used in the paper: Denter, N. M., & Lai, M. Y. (2022). Measuring generative appropriability: Experiments with US semiconductor patents. World Patent Information. doi:10.1016/j.wpi.2022.102130. https://www.sciencedirect.com/science/article/pii/S0172219022000369?dgcid=author
