In this project, I'm measuring certain electronic data amplified with INA110KP Integrated Circuit chip via NI-SCB-68 and PXI-1033 at intervals of 20μs.The entire process is recorded with a Fast camera (Phantom Miro M310) at intervals of∼66μs. The images are analysed with MATLAB Image Processing Toolbox. These codes can be used to measure lengths with sub-pixel resolution. I am using these for Dynamic Buckling Analysis of experiments performed in Soft Matter Lab at TIFR.
We take an image that looks as below:
And we get detected points in blue and red as I've labeled on the above black and white image:
We present a solution using Method of Lines.