Automated Defect Analysis of Block Copolymers
Jeffrey N. Muprhy @MurphysLab
##About
Code written for the analysis of defects in line patterns produced from the domains of block copolymer thin films. Sample SEM images can be obtained from https://hdl.handle.net/10402/era.41438.
The code is made available for use and modification under the "MIT License".
If you have any questions, or wish to contribute to the code, please contact the author.
##Instructions
A walk-through of the ImageJ code as run is available in the supporting information section of our 2015 PLoS ONE paper, "Automated Defect and Correlation Length Analysis of Block Copolymer Thin Film Nanopatterns" which is freely available at DOI: 10.1371/journal.pone.0133088. The walk-through is also available as a Google Document at: https://goo.gl/Gncg2Y.
Scripts:
- ADAblock.ijm — The algorithm is designed to perform analysis of images of BCP thin films or surfaces structured by BCP thin films. It is run as a macro within ImageJ.
- Data_Amalgamation_Script.py — Collects data from each of the output files produced by ADAblock.ijm, in the directories produced by ADAblock, and collects them into a single CSV file.
- Data_Sort_and_Plot.py — The data sort and plot script takes data from the CSV file produced by Data_Amalgamation_Script.py and can be used to re-sort and plot the data.
Download ImageJ: https://rsbweb.nih.gov/ij
Download Python: https://www.python.org
Open a 7-zip archive: https://www.7-zip.org