corersky / semi-conductor-image-classification-first

semi-conductor-image-classification-first

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semi-conductor-image-classification-first

semi-conductor-image-classification-first

The in-class image classification contest, in which you need to build a model and recognise bad chips and good chips.

Data

Semi-conductor images. Two classes: {"0": "good_0", "1": "bad_1"}.

Bad chips for example:

Good chips for example:

Approches

主要用了简单 CNN,ResNet20v2,和 ResNet56v2。v2 代表使用的是 ResNet version 2,20 和 56 是层数。

Loss function

Loss Function 使用 categorical_crossentropy, 随后又使用tensorflow imbalanced_data中方法进行 class weights 加权。

Results

Current best score is obtained by ResNet56v2:

Epoch AUC Public Score Date
109 0.9832 0.97156 20200225

Engineering contributions

Confusion matrix

Modified TensorFlow official confusion matrix metrics codes in confusion_matrix_v2_1_0.py so that

  1. 2D tensor y_pred and y_true input can be accepted;
  2. class_id can be specified when collecting these metrics such as: false positive, false negative, Recall, AUC.

Test focal loss from Tensorflow Models

https://github.com/tensorflow/models/blob/master/official/vision/keras_cv/losses/focal_loss.py

License

MIT License

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semi-conductor-image-classification-first

License:MIT License


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