TEMGYMAdvanced
Code for TEMGYM Advanced papers.
If you find use for this software, please cite the following:
TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing
TEMGYM Advanced – NanoMi lens characterisation
Documentation and refactoring to make it more readable to be added in the coming weeks/months.
Please cite the following article when using this software: David Landers, Ian Clancy, Rafal E. Dunin-Borkowski, Dieter Weber, Andrew Stewart, TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing, Ultramicroscopy,Volume 250,2023,113738,https://doi.org/10.1016/j.ultramic.2023.113738.