SAT-based ATPG using TG-Pro model
This is an implementation of SAT-based Automatic Test Pattern Generator for single stuck-at faults that uses TG-Pro model with several modifications:
- XOR gate is not expanded and uses XOR as sensitization constraint
- Partial circuit CNF is used for good clause set if only some of primary outputs are needed for fault propagation (controlled by threshold)
- CaDiCaL is used for SAT solving
Fault detection will run on fault list with equivalent faults collapsed.
We do not use TG-Pro-ALL optimizations and there is no fault simulation and structural ATPG engine like in TG-System.
TG-Pro is described in this article:
Chen, Huan, and Joao Marques-Silva. "A two-variable model for SAT-based ATPG." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 32, no. 12 (2013): 1943-1956.
Building
Linux only, will probably compile on Windows if you set USE_CADICAL to 0, but you'll need to provide alternative solver or modify the code and tests to work without the solver.
Build with cmake:
mkdir _build && cd _build
cmake --build .
Running
Only bench format is accepted:
_build/bin/atpgSat *.bench
You can find the instances here: