Generate more random test inputs

[Yang Hau]

The current test inputs are listed as following.

    float *mTestFloatPointer1;
    float *mTestFloatPointer2;
    int32_t *mTestIntPointer1;
    int32_t *mTestIntPointer2;

It seems the generated numbers are not quite random, which may reduce the coverage of tests.

[Cuda Chen]

Hi @howjmay ,

The test inputs are created by the following function in tests/impl.cpp:

SSE2NEONTestImpl::SSE2NEONTestImpl(void)
{
    mTestFloatPointer1 = (float *) platformAlignedAlloc(sizeof(__m128));
    mTestFloatPointer2 = (float *) platformAlignedAlloc(sizeof(__m128));
    mTestIntPointer1 = (int32_t *) platformAlignedAlloc(sizeof(__m128i));
    mTestIntPointer2 = (int32_t *) platformAlignedAlloc(sizeof(__m128i));
    srand(0);
    for (uint32_t i = 0; i < MAX_TEST_VALUE; i++) {
        mTestFloats[i] = ranf(-100000, 100000);
        mTestInts[i] = (int32_t) ranf(-100000, 100000);
    }
}

For my first glance, I think we can change the input of srand() to some dynamic number (e.g., current timestamp).

[Yang Hau]

We should stick to deterministic random number generation in the tests.
Therefore, this issue is not necessary anymore.